Astronics Receives Global Technology Award for Semiconductor System-Level Test Platform


Astronics Will Highlight ATS 5034 SLT Platform at the Upcoming International Test Conference

East Aurora, USA | October 30, 2018– Astronics Corporation, a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today that its wholly owned subsidiary, Astronics Test Systems, has received the Global SMT & Packaging Journal’s 2018 Global Technology Award in the test equipment category for its ATS 5034 System-Level Test (SLT) Platform.

The Global SMT & Packaging Journal presented the award on October 17, 2018 at the SMTA International 2018 conference in Chicago, Illinois. The ATS 5034 SLT Platform received the award based on the following criteria: innovation, speed/throughput improvements, quality contribution, cost benefits, environmental consideration, ease of use/implementation, and maintainability. Jon Sinskie, Astronics Test Systems’ Executive Vice President of Semiconductor Test, accepted the award on the company’s behalf. Astronics will highlight the ATS 5034 SLT Platform at the International Test Conference (ITC) in Phoenix, Arizona, October 30 through November 1.

“Our goal is to help customers reduce cost of test and ensure optimal performance of their critical electronics,” commented Sinskie. “We are honored to receive this recognition and I congratulate our team on developing such a groundbreaking solution. This platform’s capabilities to test a variety of devices for a myriad of applications are simply unmatched in the industry.”

About the ATS 5034 SLT Platform

The ATS 5034 SLT Platform uses system-level test to examine at-speed and functional performance characteristics of the device under test (DUT) to find defects missed during traditional ATE functional testing. Essentially, it tests the device in “mission-mode” or its end-use environment.

Comments are closed.